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  1. DIGILEM - Interferometric Endpoint Detector & Thin Film Monitor

    Interferometry is a powerful technique that can be used for endpoint detection of planar layer and trench etching, or deposition
    plasma2
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    deposition2
    etch1
    interference1
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    endpoint1
    interferometry1
    film thickness1
    interferometers1
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    endpointer1
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    etch rate1
    thin film monitors1
    Digilem0
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    semiconductor characterisation0

    www.digilem.com - 2009-02-08

paint3 glossmeter1 glass3 interior3 endpointer1 colorimeter1 gloss meter1 interferometers1 metrology2 optics2 color3 etch1 paint testing1 engrave1 byk-gardner1 interferometer1 painting4 etching2

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